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2005 IEEE International Workshop on Memory Technology, Design, and Testing Mtdt 2005
- ISBN13：9780769523132
- 出版社：IEEE
- 作者：Guo Li Qing Hua Da Xue
- 裝訂：平裝
- 出版日：2005/01/01
定 價：NT$ 5915 元
優惠價：90 折 5324 元
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In these proceedings for the August 2005 workshop, contributors describe their most recent work in what must be one of the most commercially applicable fields in computer science. Topics include nonvolatile memory (including an embedded OTP fuse in a CMOS logic process and a Nor-type MLC ROM with a sensing scheme for embedded applications), new memory devices (including an investigation into three-level ferrocentric memory), DRAM design and test (including embedded DRAMs), built-in self-test schemes (including an FSM-based programmable memory BIST with a macro command), memory test and SRAM design and characterization (including a reliability enhancement of CMOS SRAMs. Annotation ©2005 Book News, Inc., Portland, OR (booknews.com)
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