American Legal Injustice ─ Behind the Scenes with an Expert Witness
- ISBN13：9780765707758
- 出版社：Jason Aronson Inc
- 作者：Emanuel Tanay M.D.; Robert I. Simon (FRW)
- 裝訂／頁數：平裝／293頁
- 規格：23.5cm*15.9cm*2.5cm (高/寬/厚)
- 出版日：2010/09/30
定 價：NT$ 7150 元
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Forensic psychiatrist Emanuel Tanay has testified in thousands of court cases as an expert witness, including such notorious cases as those of Jack Ruby, Sam Sheppard, and Theodore 'Ted' Bundy. Tanay walks the reader through his experiences in the courtroom, explaining the role of the forensic psychiatrist in the litigation process and providing a 'behind-the-scenes' view of our criminal justice system, including individual chapters on some of his most interesting and infamous cases. Tanay also provides clear examples of the rampant injustice that he has witnessed and argues that the potential for injustice is built into our legal system in the form of incompetent lawyers, the imbalance of resources between the pricey defense lawyers hired by large corporations in civil trials and the inexperienced lawyers often hired by plaintiffs, and the political concerns of elected judges and prosecutors. American Legal Injustice: Behind the Scenes with an Expert Witness is a must-read for Law & Order, Court TV, andtrue crime enthusiasts.
作者簡介
Emanuel Tanay, M.D., is clinical professor of psychiatry at Wayne State University and a distinguished fellow of both the American Psychiatric Association and the American Academy of Forensic Sciences. He has provided forensic psychiatric expert testimony for more than 50 years.
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