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【簡體曬書節】 單本79折,5本7折,優惠只到5/31,點擊此處看更多!

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原文書 (6)
商品狀況

可訂購商品 (6)
庫存狀況

無庫存 (6)
商品定價

$800以上 (6)
出版日期

2016年以前 (6)
裝訂方式

平裝 (4)
精裝 (2)
作者

Patrick Echlin (3)
Joseph Goldstein/ Dale E. Newbury/ David C. Joy/ Charles E. Lyman/ Patrick Echlin (1)
Joseph Goldstein/ Dale E. Newbury/ Patrick Echlin/ David C. Joy/ Charles Fiori (1)
Patrick Echlin/ C. E. Fiori/ Joseph Goldstein/ David C. Joy/ Dale E. Newbury (1)
出版社/品牌

Springer Verlag (5)
PBKSPRIV (1)

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6筆商品,1/1頁
Low-Temperature Microscopy and Analysis
作者:Patrick Echlin  出版社:PBKSPRIV  出版日:1992/04/01 裝訂:精裝
Low-temperature microscopy and analysis is not the sole preserve of biologists and those interested in hydrated organic samples although these types of samples present both the greatest challenge to t
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
作者:Patrick Echlin  出版社:Springer Verlag  出版日:2009/03/06 裝訂:精裝
This Handbook is a complete guide to preparing a wide variety of specimens for the scanning electron microscope and x-ray microanalyzer. Specimens range from inorganic, organic, biological, and geolo
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Handbook of Sample Preparation for Scanning Electron Microscopy and X-ray Microanalysis
作者:Patrick Echlin  出版社:Springer Verlag  出版日:2010/11/23 裝訂:平裝
This Handbook is a complete guide to preparing a wide variety of specimens for the scanning electron microscope and x-ray microanalyzer. Specimens range from inorganic, organic, biological, and geolog
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Scanning Electron Microscopy and X-ray Microanalysis ― A Text for Biologists, Materials Scientists, and Geologists
作者:Joseph Goldstein; Dale E. Newbury; Patrick Echlin; David C. Joy; Charles Fiori  出版社:Springer Verlag  出版日:2013/03/20 裝訂:平裝
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors wit
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Advanced Scanning Electron Microscopy and X-ray Microanalysis
作者:Patrick Echlin; C. E. Fiori; Joseph Goldstein; David C. Joy; Dale E. Newbury  出版社:Springer Verlag  出版日:2013/06/08 裝訂:平裝
This book has its origins in the intensive short courses on scanning elec- tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Scanning Electron Microscopy and X-Ray Microanalysis
作者:Joseph Goldstein; Dale E. Newbury; David C. Joy; Charles E. Lyman; Patrick Echlin  出版社:Springer Verlag  出版日:2013/05/31 裝訂:平裝
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical a
若需訂購本書,請電洽客服
02-25006600[分機130、131]。

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