Precision Landmark Location for Machine Vision and Photogrammetry ― Finding and Achieving the Maximum Possible Accuracy
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商品簡介
This book addresses the problem of measurement error associated with determining the location of landmarks in images. The least possible photogrammetric uncertainty in a given situation is determined using the Cramer–Rao Lower Bound (CRLB).
The monograph provides the reader with: the most complete treatment to date of precision landmark location and the engineering aspects of image capture and processing; detailed theoretical treatment of the CRLB, and more.
作者簡介
Jose A. Gutierrez is Principal Engineer at the Innovation Center of Eaton Corporation, leading the technical activities in Wireless Sensor Networks. He received the B.S. degree in electronic engineering from Universidad Simon Bolivar in Caracas, Venezuela, in 1991, and the M.S. in electrical engineering from the University of Wisconsin - Milwaukee in 2001. Currently he is a Ph.D. candidate at the same institution. Mr. Gutierrez is an active member of the IEEE LAN/MAN Standards Committee and Editor in-Chief of the IEEE 802.15 Working Group, Task Group 4, focused in the development of Low-Rate Wireless Personal Area Networks. His areas of expertise include control systems, wireless communication, networking, information theory, bioelectronics, and standards development. He has two patents filed and is author of several papers in the areas of automatic control, artificial intelligence, and wireless communications.
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