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【簡體曬書節】 單本79折,5本7折,優惠只到5/31,點擊此處看更多!
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原文書 (4)
商品狀況

可訂購商品 (4)
庫存狀況

無庫存 (4)
商品定價

$800以上 (4)
出版日期

2016年以前 (4)
裝訂方式

平裝 (1)
精裝 (3)
作者

S. J. B. Reed (2)
Margui (1)
Ron Jenkins/ R. W. Gould/ Dale Gedcke (1)
出版社/品牌

Cambridge Univ Pr (2)
PBKMNTMU (1)
Taylor & Francis (1)

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4筆商品,1/1頁
Quantitative X-Ray Spectrometry
作者:Ron Jenkins; R. W. Gould; Dale Gedcke  出版社:Taylor & Francis  出版日:1995/04/01 裝訂:精裝
A substantially revised reference covering virtually every important aspect of x-ray spectrometry from basic principles to the selection of instrument parameters and sample preparation. Chapters cover
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
X-RAY FLUORESCENCE SPECTROMETRY AND RELATED TECHNIQUES
作者:Margui  出版社:PBKMNTMU  出版日:2013/02/15 裝訂:精裝
X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of materials. It is known for its rapid speed and
若需訂購本書,請電洽客服
02-25006600[分機130、131]。
Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
90折
作者:S. J. B. Reed  出版社:Cambridge Univ Pr  出版日:2010/06/10 裝訂:平裝
Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers,
定價:2469 元, 優惠價:9 2222
無庫存,下單後進貨(到貨天數約45-60天)
Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
作者:S. J. B. Reed  出版社:Cambridge Univ Pr  出版日:2005/08/25 裝訂:精裝
Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers,
若需訂購本書,請電洽客服
02-25006600[分機130、131]。

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