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即日起~6/30,暑期閱讀書展,好書7折起

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2016~2017 (5)
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Mohamed Atef/ Horst Zimmermann (2)
Souvik Mahapatra (EDT) (2)
Alexander Trubin (1)
Amir Zjajo (1)
Anas N. Al-Rabadi (1)
Athanasios Dimoulas (EDT)/ Evgeni Gusev (EDT)/ Paul C. McIntyre (EDT)/ Marc Heyns (EDT) (1)
B. Sharat Chandra Varma/ Kolin Paul/ M. Balakrishnan (1)
Bernhard Goll/ Horst Zimmermann (1)
Bernhard Wicht (1)
Changhwan Shin (1)
Detlev Richter (1)
Dominic Maurath/ Yiannos Manoli (1)
Fadhel M. Ghannouchi/ Mohammad S. Hashmi (1)
Geert Hellings/ Kristin De Meyer (1)
Heimo Uhrmann/ Robert Kolm/ Horst Zimmermann (1)
Horst Zimmermann (1)
Jacopo Franco/ Ben Kaczer/ Guido Groeseneken (1)
Koichiro Ishibashi (EDT)/ Kenichi Osada (EDT) (1)
M. Ingels/ Michiel Steyaert (1)
M. Reisch (1)
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Springer Verlag (35)
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37筆商品,1/2頁
Stochastic Process Variation in Deep-Submicron CMOs ─ Circuits and Algorithms
90折
作者:Amir Zjajo  出版社:Springer Verlag  出版日:2013/11/28 裝訂:精裝
One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control, the emergence of new systematic variation-generating mechanisms, and most importantly, the increase in atomic-scale randomness, where device operation must be described as a stochastic process. In addition to wide-sense stationary stochastic device variability and temperature variation, existence of non-stationary stochastic electrical noise associated with fundamental processes in integrated-circuit devices represents an elementary limit on the performance of electronic circuits.In an attempt to address these issues, Stochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms offers unique combination of mathematical treatment of random process variation, electrical
定價:6000 元, 優惠價:9 5400
庫存:1
Time-to-Digital Converters
作者:Stephan Henzler  出版社:Springer Verlag  出版日:2010/03/15 裝訂:精裝
With ongoing technology scaling high resolution in the voltage domain becomes increasingly troublesome. Time domain resolution, however, is continuously improving as digital circuits become faster in
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02-25006600[分機130、131]。
Adiabatic Logic ─ Future Trend and System Level Perspective
作者:Philip Teichmann  出版社:Springer Verlag  出版日:2011/10/29 裝訂:精裝
Adiabatic logic is a potential successor for static CMOS circuit design when it comes to ultra-low-power energy consumption. Future development like the evolutionary shrinking of the minimum feature s
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02-25006600[分機130、131]。
Electronic Devices for Analog Signal Processing
作者:Yu. K. Rybin  出版社:Springer Verlag  出版日:2011/10/12 裝訂:精裝
Electronic Devices for Analog Signal Processing is intended for engineers and post graduates and considers electronic devices applied to process analog signals in instrument making, automation, measur
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02-25006600[分機130、131]。
Gettering Defects in Semiconductors
作者:V. A. Perevostchikov; V. D. Skoupov  出版社:Springer Verlag  出版日:2005/12/15 裝訂:精裝
Gettering Defects in Semiconductors fulfills three basic purposes:– to systematize the experience and research in exploiting various gettering techniques in microelectronics and nanoelectronics;– to i
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02-25006600[分機130、131]。
Delta-Sigma A/D-Converters ─ Practical Design for Communication Systems
作者:Richard Gaggl  出版社:Springer Verlag  出版日:2012/12/16 裝訂:精裝
The emphasis of this book is on practical design aspects for broadband A/D converters for communication systems. The embedded designs are employed for transceivers in the field of ADSL solutions and W
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02-25006600[分機130、131]。
Poly-Sige for Mems-Above-CMOS Sensors
作者:Pilar Gonzalez Ruiz; Kristin De Meyer; Ann Witvrouw  出版社:Springer Verlag  出版日:2013/07/31 裝訂:精裝
Polycrystalline SiGe has emerged as a promising MEMS (Microelectromechanical Systems) structural material since it provides the desired mechanical properties at lower temperatures compared to poly-Si,
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02-25006600[分機130、131]。
High Mobility and Quantum Well Transistors ─ Design and TCAD Simulation
作者:Geert Hellings; Kristin De Meyer  出版社:Springer Verlag  出版日:2013/04/30 裝訂:精裝
For many decades, the semiconductor industry has miniaturized transistors, delivering increased computing power to consumers at decreased cost. However, mere transistor downsizing does no longer provi
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02-25006600[分機130、131]。
High Permittivity Gate Dielectric Materials
作者:Samares Kar (EDT)  出版社:Springer Verlag  出版日:2013/06/30 裝訂:精裝
"The book comprehensively covers all the current and the emerging areas of the physics and the technology of high permittivity gate dielectric materials, including, topics such as MOSFET basics and ch
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02-25006600[分機130、131]。
Analog Filters in Nanometer CMOS
作者:Heimo Uhrmann; Robert Kolm; Horst Zimmermann  出版社:Springer Verlag  出版日:2013/08/31 裝訂:精裝
Starting from the basics of analog filters and the poor transistor characteristics in nanometer CMOS 10 high-performance analog filters developed by the authors in 120 nm and 65 nm CMOS are described
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02-25006600[分機130、131]。
Advanced Materials for Integrated Optical Waveguides
作者:Xingcun Colin Tong  出版社:Springer Verlag  出版日:2013/10/31 裝訂:精裝
This book provides a comprehensive introduction to integrated optical waveguides for information technology and data communications. Integrated coverage ranges from advanced materials, fabrication, an
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02-25006600[分機130、131]。
Reliability of High Mobility Sige Channel Mosfets for Future Cmos Applications
作者:Jacopo Franco; Ben Kaczer; Guido Groeseneken  出版社:Springer Verlag  出版日:2013/10/31 裝訂:精裝
Due to the ever increasing electric fields in scaled CMOS devices, reliability is becoming a showstopper for further scaled technology nodes. Although several groups have already demonstrated function
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02-25006600[分機130、131]。
Current Sense Amplifiers ― For Embedded Sram in High-Performance System-On-A-Chip Designs
作者:Bernhard Wicht  出版社:Springer Verlag  出版日:2003/08/01 裝訂:精裝
This book provides a systematic and comprehensive insight into current sensing techniques. In addition to describing theoretical and practical aspects of current sensing, the author derives practical
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02-25006600[分機130、131]。
Reversible Logic Synthesis ― From Fundamentals to Quantum Computing
作者:Anas N. Al-Rabadi  出版社:Springer Verlag  出版日:2003/12/01 裝訂:精裝
For the first time in book form, this comprehensive and systematic monograph presents methods for the reversible synthesis of logic functions and circuits. It is illustrated with a wealth of examples
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02-25006600[分機130、131]。
Comparators in Nanometer Cmos Technology
作者:Bernhard Goll; Horst Zimmermann  出版社:Springer Verlag  出版日:2014/09/25 裝訂:精裝
This book covers the complete spectrum of the fundamentals of clocked, regenerative comparators, their state-of-the-art, advanced CMOS technologies, innovative comparators inclusive circuit aspects, t
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02-25006600[分機130、131]。
Field Emission Electronics
作者:Nikolay Egorov; Evgeny Sheshin  出版社:Springer Verlag  出版日:2017/06/09 裝訂:精裝
This book is dedicated to field emission electronics, a promising field at the interface between “classic” vacuum electronics and nanotechnology. In addition to theoretical models, it includes detaile
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02-25006600[分機130、131]。
Power Management of Digital Circuits in Deep Sub-micron Cmos Technologies
作者:S. Henzler  出版社:Springer Verlag  出版日:2006/10/15 裝訂:精裝
This book provides an in-depth overview of design and implementation of leakage reduction techniques. The focus is on applicability, technology dependencies, and scalability. The book mainly deals wit
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02-25006600[分機130、131]。
Variation-aware Advanced Cmos Devices and Sram
作者:Changhwan Shin  出版社:Springer Verlag  出版日:2016/06/16 裝訂:精裝
This book provides a comprehensive overview of contemporary issues in complementary metal-oxide semiconductor (CMOS) device design, describing how to overcome process-induced random variations such as
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02-25006600[分機130、131]。
Optoelectronic Circuits in Nanometer Cmos Technology
作者:Mohamed Atef; Horst Zimmermann  出版社:Springer Nature  出版日:2018/04/25 裝訂:平裝
This book describes the newest implementations ofintegrated photodiodes fabricated in nanometer standard CMOS technologies. Italso includes the required fundamentals, the state-of-the-art, and the des
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02-25006600[分機130、131]。
Low Power and Reliable SRAM Memory Cell and Array Design
作者:Koichiro Ishibashi (EDT); Kenichi Osada (EDT)  出版社:Springer Verlag  出版日:2011/08/19 裝訂:精裝
Success in the development of recent advanced semiconductor device technologies is due to the success of SRAM memory cells. This book addresses various issues for designing SRAM memory cells for advan
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02-25006600[分機130、131]。
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