Single Event Effects In Aerospace

"Single event effects" (SEEs) refers to the radiation effects encountered in space-borne electronic systems that arise through the action of a single ionizing particle as it penetrates sensitive nodes within electronic devices, which can lead to seemingly random errors and even system failures. This volume is presented by Petersen (a consultant formerly with the US Naval Research Laboratory) as a tutorial on the basic terminology and concepts of SEEs and their rate prediction and is based on revised and updated notes for a 2008 NSREC (Nuclear and Space Radiation Effects Conference) Short Course. It describes the foundational issues of the subject, as well as issues that are important for measuring single event upset phenomenon and the interpretation of measurements. Attention is also given to experimental aspects from nuclear physics that are infrequently addressed in electrical engineering courses. Annotation c2011 Book News, Inc., Portland, OR (booknews.com)

EDWARD PETERSEN, PhD, worked for the Naval Research Laboratory from 1969 to 1993. Since then, he has served as a consultant. Dr. Petersen's research has focused on estimating upset rates for satellite systems. His work has shown that measurements of space upset rates are consistent with predictions based on laboratory experiments. He has authored or coauthored sixty papers on radiation effects, the majority dealing with single event effects. An IEEE Fellow, Dr. Petersen was the recipient of the IEEE Nuclear and Plasma Sciences Society Radiation Effects Award.