Statistical Intervals: A Guide For Practitioners And Researchers, Second Edition
商品資訊
系列名：Wiley Series in Probability and Statistics
ISBN13：9780471687177
出版社：John Wiley & Sons Inc
作者：Meeker
出版日：2017/03/31
裝訂／頁數：精裝／648頁
規格：26.7cm*19.1cm*3.2cm (高/寬/厚)
版次：2
商品簡介
作者簡介
William Q. Meeker is Professor of Statistics and Distinguished Professor of Liberal Arts and Sciences at Iowa State University. He is co-author of Statistical Methods for Reliability Data (Wiley, 1998) and of numerous publications in the engineering and statistical literature and has won many awards for his research.
Gerald J. Hahn served for 46 years as applied statistician and manager of an 18-person statistics group supporting General Electric and has co-authored four books. His accomplishments have been recognized by GE’s prestigious Coolidge Fellowship and 19 professional society awards.
Luis A. Escobar is Professor of Statistics at Louisiana State University. He is co-author of Statistical Methods for Reliability Data (Wiley, 1998) and several book chapters. His publications have appeared in the engineering and statistical literature and he has won several research and teaching awards.
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