Energy Efficient and Reliable Embedded Nanoscale Sram Design
商品資訊
ISBN13:9781032081595
出版社:CRC PR INC
作者:Bhupendra Singh Reniwal
出版日:2023/11/01
裝訂:精裝
商品簡介
This reference text covers a wide spectrum for designing robust embedded memory and peripheral circuitry. It will serve as a useful text for senior undergraduate, graduate students and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering.
- Discusses low power design methodologies for SRAM.
- Covers radiation hardened SRAM design for aerospace applications.
- Focusses on various reliability issues which are faced by sub-micron technologies.
- Exhibits more stable memory topologies.
Nanoscale technologies unveiled significant challenges to the design of energy efficient and reliable SRAMs. This reference text investigates the impact of process variation, leakage, aging, soft errors and related reliability issues in embedded memory and periphery circuitry.
The text adopts a unique way to explain SRAM bitcell, array design and analysis of its design parameters to meet the sub-nano-regime challenges for CMOS devices. It comprehensively covers low power design methodologies for SRAM, exhibits more stable memory topologies, and radiation hardened SRAM design for aerospace applications. Every chapter includes glossary, highlights, question bank, and problems. The text will serve as a useful text for senior undergraduate, graduate students and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. Discussing compressively study of variability induced failure mechanism in sense amplifiers and power, delay and read yield trade-offs, this reference text will serve as a useful text for senior undergraduate, graduate students and professionals in areas including electronics and communications engineering, electrical engineering, mechanical engineering, and aerospace engineering. It covers development of robust SRAMs, well suited for low-power multi-core processors for wireless sensors node, battery-operated portable devices, personal healthcare assistants and smart IoT applications.
主題書展
更多書展今日66折
您曾經瀏覽過的商品
購物須知
外文書商品之書封,為出版社提供之樣本。實際出貨商品,以出版社所提供之現有版本為主。部份書籍,因出版社供應狀況特殊,匯率將依實際狀況做調整。
無庫存之商品,在您完成訂單程序之後,將以空運的方式為你下單調貨。為了縮短等待的時間,建議您將外文書與其他商品分開下單,以獲得最快的取貨速度,平均調貨時間為1~2個月。
為了保護您的權益,「三民網路書店」提供會員七日商品鑑賞期(收到商品為起始日)。
若要辦理退貨,請在商品鑑賞期內寄回,且商品必須是全新狀態與完整包裝(商品、附件、發票、隨貨贈品等)否則恕不接受退貨。