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Advanced Mathematical and Computational Tools in Metrology and Testing X
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作者:Franco Pavese (EDT); Wolfram Bremser (EDT); Anna Chunovkina (EDT)  出版社:World Scientific Pub Co Inc  出版日:2015/06/22 裝訂:精裝
From a September 2014 international conference in St. Petersburg, Russia, 50 papers explore mathematical, statistical, and numerical tools and techniques in metrology and testing. Their topics include
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定價:5372 元, 優惠價:9 4835
作者:Alistair B. Forbes (EDT); Anna Chunovkina (EDT); Sascha Eichstadt (EDT)  出版社:World Scientific Pub Co Inc  出版日:2019/01/08 裝訂:精裝
This volume contains original, refereed contributions by researchers from institutions and laboratories across the world that are involved in metrology and testing. They were adapted from presentation
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作者:Valery A. Slaev; Anna G. Chunovkina; Leonid A. Mironovksy  出版社:De Gruyter  出版日:2013/06/30 裝訂:精裝
Metrology is the science of measurements. It is traceable to measurement standards, thus to the concept of measurement accuracy, which is used in all natural and technical sciences, as well as in some
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