Papers of the symposium held April 13-16, 1993 in San Francisco, Calif., on: novel analysis techniques to characterize materials and device properties, process integration, degradation and modelling,
Sixty-two proceedings papers presenting new advancements for the April 1996 symposium expanding the understanding of ferroelectric thin films and processing technology. The contributors cover topics
Papers from the fall 1994 symposium present research and developments from academia, government, organizations, and industry in ferroelectric thin films, organized in sections on characterization, lay
