Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor indu
This book is a fundamental VLSI Testing and Design-for-Testability (DFT) textbook allowing undergraduates, DFT practitioners, and VLSI designers to learn quickly the basic VLSI Test concepts, princip
This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an "adjacent" field will find this an invaluable reference to t
