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三民出版.新書搶先報|最速、最優惠的新鮮貨報給你知!

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2016~2017 (1)
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T. Mitch Wallis (1)
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Cambridge Univ Pr (1)

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作者:T. Mitch Wallis  出版社:Cambridge Univ Pr  出版日:2017/10/31 裝訂:精裝
Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials. • Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides • Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy • Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materials Featuring numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and gra
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