TOP
0
0
購書領優惠,滿額享折扣!

縮小範圍


商品類型

原文書 (4)
商品狀況

可訂購商品 (4)
庫存狀況

無庫存 (4)
商品定價

$800以上 (4)
出版日期

2017年以前 (4)
作者

Edited by J. Joseph Clement 、William F. Filter 、Patrick M. Lenahan 、Anthony S. Oates 、Robert Rosenberg (1)
Edited by Kenneth P. Rodbell 、William F. Filter 、Harold J. Frost 、Paul S. Ho (1)
Edited by Peter Børgesen 、John C. Coburn 、William F. Filter 、John E. Sanchez、Jr. 、Kenneth P. Rodbell (1)
Edited by William F. Filter 、Kamesh Gadepally 、A. Lindsay Greer 、Anthony S. Oates 、Robert Rosenberg (1)
出版社/品牌

CAMBRIDGE UNIVERSITY PRESS (4)

三民網路書店 / 搜尋結果

4筆商品,1/1頁
Materials Reliability in Microelectronics III:VOLUME309
90折
作者:Edited by Kenneth P. Rodbell ; William F. Filter ; Harold J. Frost ; Paul S. Ho  出版社:CAMBRIDGE UNIVERSITY PRESS  出版日:1993/08/31 裝訂:平裝
The proceedings of the title symposium, held in San Francisco in April 1993, comprise invited and contributed papers in the areas of dielectric reliability; microstructure effects on reliability; stre
無庫存,下單後進貨(到貨天數約30-45天)
定價:1665 元, 優惠價:9 1499
Materials Reliability in Microelectronics V:VOLUME391
90折
Mirroring the topical content of the April 1995 symposium (held at the MRS Spring Meeting), this volume contains invited and contributed papers in the areas of modeling and simulation of failure mecha
無庫存,下單後進貨(到貨天數約30-45天)
定價:1665 元, 優惠價:9 1499
Materials Reliability in Microelectronics VI:VOLUME428
90折
The annual snapshot of the subject presents 78 papers covering a historical summary of the past 30 years, copper metallization, the characterization of electromigration phenomena, modeling, microstruc
無庫存,下單後進貨(到貨天數約30-45天)
定價:1665 元, 優惠價:9 1499
Materials Reliability in Microelectronics IV:VOLUME338
90折
Proceedings from the Materials Research Society symposium held in San Francisco, April 1994. Invited and contributed papers cover oxides, thin films, experimental techniques, stress in semiconductors
無庫存,下單後進貨(到貨天數約30-45天)
定價:1665 元, 優惠價:9 1499

暢銷榜

客服中心

收藏

會員專區